Volume 2015

Surface Science Tools for Nanomaterials Characterization

Editors: Challa S. S. R. Kumar
ISBN: 978-3-662-44550-1 (Print) 978-3-662-44551-8 (Online)
DOI: 10.1007/978-3-662-44551-8

Table of contents (16 documents)

  1. Online Document 1

    Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM)

    Max Herpich, Jochen Friedl, Ulrich Stimming

  2. Online Document 2

    Recovering Time-Resolved Imaging Forces in Solution by Scanning Probe Acceleration Microscopy: Theory and Application

    Maxmore Chaibva, Nicole Shamitko-Klingensmith, Justin Legleiter

  3. Online Document 3

    Scanning Probe Microscopy for Nanolithography

    C. B. Samantaray

  4. Online Document 4

    Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology

    Da Luo, Hao Sun, Yan Li

  5. Online Document 5

    Field Ion Microscopy for the Characterization of Scanning Probes

    William Paul, Peter Grütter

  6. Online Document 6

    Scanning Conductive Torsion Mode Microscopy

    Ling Sun, Elmar Bonaccurso

  7. Online Document 7

    Field Ion and Field Desorption Microscopy: Principles and Applications

    Yuri Suchorski

  8. Online Document 8

    Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces

    Mehmet Z. Baykara

  9. Online Document 9

    Applications of Synchrotron-Based X-Ray Photoelectron Spectroscopy in the Characterization of Nanomaterials

    W. H. Doh, V. Papaefthimiou, S. Zafeiratos

  10. Online Document 10

    Exploration into the Valence Band Structures of Organic Semiconductors by Angle-Resolved Photoelectron Spectroscopy

    Yasuo Nakayama, Hisao Ishii

  11. Online Document 11

    Band Bending at Metal-Semiconductor Interfaces, Ferroelectric Surfaces and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy

    Nicoleta Georgiana Apostol, Cristian-Mihail Teodorescu

  12. Online Document 12

    Higher Resolution Scanning Probe Methods for Magnetic Imaging

    S. N. Piramanayagam, Binni Varghese

  13. Online Document 13

    Imaging and Characterization of Magnetic Micro- and Nanostructures Using Force Microscopy

    Stephan Block

  14. Online Document 14

    Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Three-Dimensional Magnetic Nanostructures

    Amalio Fernández-Pacheco, Russell P. Cowburn, Luis E. Serrano-Ramón, M. Ricardo Ibarra, José M. Teresa

  15. Online Document 15

    High Resolution STM Imaging

    Alexander N. Chaika

  16. Online Document 16

    Numerical and Finite Element Simulations of Nanotips for FIM/FEM

    Moh’d Rezeq, Ahmed E. Ali, Dirar Homouz