Surface Science Tools for Nanomaterials Characterization
Editors:
Challa S. S. R. Kumar
ISBN:
978-3-662-44550-1 (Print)
978-3-662-44551-8 (Online)
DOI:
10.1007/978-3-662-44551-8
Table of contents
(16 documents)
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Online Document 1
Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM)
Max Herpich, Jochen Friedl, Ulrich Stimming
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Online Document 2
Recovering Time-Resolved Imaging Forces in Solution by Scanning Probe Acceleration Microscopy: Theory and Application
Maxmore Chaibva, Nicole Shamitko-Klingensmith, Justin Legleiter
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Online Document 3
Scanning Probe Microscopy for Nanolithography
C. B. Samantaray
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Online Document 4
Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology
Da Luo, Hao Sun, Yan Li
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Online Document 5
Field Ion Microscopy for the Characterization of Scanning Probes
William Paul, Peter Grütter
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Online Document 6
Scanning Conductive Torsion Mode Microscopy
Ling Sun, Elmar Bonaccurso
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Online Document 7
Field Ion and Field Desorption Microscopy: Principles and Applications
Yuri Suchorski
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Online Document 8
Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces
Mehmet Z. Baykara
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Online Document 9
Applications of Synchrotron-Based X-Ray Photoelectron Spectroscopy in the Characterization of Nanomaterials
W. H. Doh, V. Papaefthimiou, S. Zafeiratos
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Online Document 10
Exploration into the Valence Band Structures of Organic Semiconductors by Angle-Resolved Photoelectron Spectroscopy
Yasuo Nakayama, Hisao Ishii
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Online Document 11
Band Bending at Metal-Semiconductor Interfaces, Ferroelectric Surfaces and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy
Nicoleta Georgiana Apostol, Cristian-Mihail Teodorescu
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Online Document 12
Higher Resolution Scanning Probe Methods for Magnetic Imaging
S. N. Piramanayagam, Binni Varghese
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Online Document 13
Imaging and Characterization of Magnetic Micro- and Nanostructures Using Force Microscopy
Stephan Block
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Online Document 14
Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Three-Dimensional Magnetic Nanostructures
Amalio Fernández-Pacheco, Russell P. Cowburn, Luis E. Serrano-Ramón, M. Ricardo Ibarra, José M. Teresa
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Online Document 15
High Resolution STM Imaging
Alexander N. Chaika
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Online Document 16
Numerical and Finite Element Simulations of Nanotips for FIM/FEM
Moh’d Rezeq, Ahmed E. Ali, Dirar Homouz
