TEM for Characterization of Core-Shell Nanomaterials

Abstract

Transmission electron microscope is an essential tool for characterization of nanoscale materials and devices because it can shed light on the microstructure of nanomaterials. For core-shell nanostructured materials, transmission electron microscopy (TEM) can provide much more important information: overall particle size, core size, shell thickness, uniform or nonuniform shell coating, lattice fringe, elemental distribution, etc. In this chapter we will describe the application of TEM for characterization of core-shell nanomaterials.

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Title
TEM for Characterization of Core-Shell Nanomaterials
Book Title
Transmission Electron Microscopy Characterization of Nanomaterials
Book DOI
10.1007/978-3-642-38934-4
Chapter DOI
10.1007/978-3-642-38934-4_6
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Volume
Editors
  • Challa S.S.R. Kumar Send Email (1)
  • Editor Affiliation
  • 1 Center for Advanced Microstructures and Devices, Baton Rouge, Louisiana, USA
  • Authors
  • Yiqian Wang Send Email (2)
  • Chao Wang (2)
  • Author Affiliation
  • 2 The Cultivation Base for State Key Laboratory, Qingdao University, No. 308 Ningxia Road, Qingdao, 266071, People’s Republic of China
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