Higher Resolution Scanning Probe Methods for Magnetic Imaging

Abstract

With the emergence of nanotechnology, the feature size of devices is getting smaller and smaller and the demand for higher resolution imaging tools is growing. For the visualization of magnetic domains of nanostructures and thin films, magnetic force microscopy is the feasible and most utilized technique. The resolution of MFM is about 20–30 nm in the current instruments and efforts to improve the resolution in the sub-10 nm range are in progress. In this chapter, an overview of key research findings of several researchers and recent advances in the direction of improving the MFM resolution is provided.

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Title
Higher Resolution Scanning Probe Methods for Magnetic Imaging
Book Title
Surface Science Tools for Nanomaterials Characterization
Book DOI
10.1007/978-3-662-44551-8
Chapter DOI
10.1007/978-3-662-44551-8_12
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Volume
Editors
  • Challa S. S. R. Kumar (10)
  • Editor Affiliation
  • 10 Center for Advanced Microstructures and Devices, Baton Rouge, LA, USA
  • Authors
  • S. N. Piramanayagam Send Email (1)
  • Binni Varghese (1)
  • Author Affiliation
  • 1 Data Storage Institute, A*STAR (Agency for Science, Technology and Research), 5, Engineering Drive 1, Singapore, 117608, Singapore
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