Imaging and Characterization of Magnetic Micro- and Nanostructures Using Force Microscopy

Abstract

This chapter introduces into the principles of different force microscopic approaches that sense a magnetic probe-sample force to study magnetism of micro- and (sub)nanometer-sized objects. Although all of them are capable to characterize magnetic properties on small length scales, their applicability depends strongly on the object (e.g., nm-thin magnetic films, magnetic nanoparticles, electronic and nuclear spins) to be investigated. A comparison of their application range will be given, which allows identifying the method most suitable for the intended measurement. Finally, the discussion of each approach is complemented by an overview about current exemplary applications.

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Title
Imaging and Characterization of Magnetic Micro- and Nanostructures Using Force Microscopy
Book Title
Surface Science Tools for Nanomaterials Characterization
Book DOI
10.1007/978-3-662-44551-8
Chapter DOI
10.1007/978-3-662-44551-8_13
Part of
Volume
Editors
  • Challa S. S. R. Kumar (10)
  • Editor Affiliation
  • 10 Center for Advanced Microstructures and Devices, Baton Rouge, LA, USA
  • Authors
  • Stephan Block (1) (2)
  • Author Affiliation
  • 1 Department of Physics, Ernst–Moritz–Arndt University of Greifswald, Felix-Hausdorff-Str. 6, Greifswald, Germany
  • 2 Applied Physics, Chalmers University of Technology, Fysikgränd 3, Gothenburg, Sweden
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