Recovering Time-Resolved Imaging Forces in Solution by Scanning Probe Acceleration Microscopy: Theory and Application

Abstract

Scanning probe acceleration microscopy (SPAM) is a technique that reconstructs the time-resolved tip/sample forces during standard tapping-mode atomic force microscopy (TMAFM) imaging in solution, allowing for the simultaneous mapping of topography and mechanical properties of surfaces. Here, we describe the relationship between tapping forces and sample mechanical properties, the theoretical basis for the SPAM technique, and its application to a variety of systems.

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Title
Recovering Time-Resolved Imaging Forces in Solution by Scanning Probe Acceleration Microscopy: Theory and Application
Book Title
Surface Science Tools for Nanomaterials Characterization
Book DOI
10.1007/978-3-662-44551-8
Chapter DOI
10.1007/978-3-662-44551-8_2
Part of
Volume
Editors
  • Challa S. S. R. Kumar (10)
  • Editor Affiliation
  • 10 Center for Advanced Microstructures and Devices, Baton Rouge, LA, USA
  • Authors
  • Maxmore Chaibva (1) (2)
  • Nicole Shamitko-Klingensmith (1) (2)
  • Justin Legleiter Send Email (1) (2) (3)
  • Author Affiliation
  • 1 The C. Eugene Bennett Department of Chemistry, West Virginia University, 217 Clark Hall, 6045, Morgantown, WV, 26505, USA
  • 2 WV NanoSAFE, West Virginia University, Morgantown, WV, 26505, USA
  • 3 The Center for Neurosciences, West Virginia University, Morgantown, WV, 26505, USA
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