Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology

Abstract

Kelvin probe force microscopy (KPFM) is applicable to measure surface potential and work function in a localized nanoscale surface area. In this chapter, we describe the theory and measurement of KPFM and its applications in the characterization of inorganic nanostructure and nanomaterials.

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Title
Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology
Book Title
Surface Science Tools for Nanomaterials Characterization
Book DOI
10.1007/978-3-662-44551-8
Chapter DOI
10.1007/978-3-662-44551-8_4
Part of
Volume
Editors
  • Challa S. S. R. Kumar (10)
  • Editor Affiliation
  • 10 Center for Advanced Microstructures and Devices, Baton Rouge, LA, USA
  • Authors
  • Da Luo (1)
  • Hao Sun (2)
  • Yan Li Send Email (1)
  • Author Affiliation
  • 1 Beijing National Laboratory for Molecular Sciences, Key Laboratory for the Physics and Chemistry of Nanodevices, College of Chemistry and Molecular Engineering, Peking University, 100871, Beijing, China
  • 2 Nano Surfaces Division, Bruker (Beijing) Scientific Technology Co., Ltd, 11 Zhongguancun South Street, 100081, Beijing, China
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