Field Ion Microscopy for the Characterization of Scanning Probes

Abstract

Scanning probe microscopy (SPM) is a widely used tool for investigating the nanoscale structure of materials, as well as their electronic and mechanical properties with its related spectroscopic modes of operation. In SPM experiments, the sharp tip which probes the material under investigation is usually uncharacterized; however, its geometry and chemical composition play a large role in the SPM’s lateral imaging resolution and the features recorded in electronic and force spectroscopies. To carry out comparisons with modeling, one must consider a set of plausible tip structures and choose the one which best reproduces the experimental data recorded with the uncharacterized tip.

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Title
Field Ion Microscopy for the Characterization of Scanning Probes
Book Title
Surface Science Tools for Nanomaterials Characterization
Book DOI
10.1007/978-3-662-44551-8
Chapter DOI
10.1007/978-3-662-44551-8_5
Part of
Volume
Editors
  • Challa S. S. R. Kumar (10)
  • Editor Affiliation
  • 10 Center for Advanced Microstructures and Devices, Baton Rouge, LA, USA
  • Authors
  • William Paul Send Email (2)
  • Peter Grütter (1)
  • Author Affiliation
  • 2 IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA, 95120, USA
  • 1 Physics Department, McGill University, 3600 University, Montréal, QC, Canada
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