Scanning Conductive Torsion Mode Microscopy

Abstract

In this chapter, we introduce a special non-contact scanning probe based current sensing technique: scanning conductive torsion mode microscopy (SCTMM), which allows for simultaneous topography and electrical current mapping on solid samples. Due to the low interacting force between the probe and sample surface, this new technique is particularly indicated for and usually applied to measurements on soft materials and fragile structures. We first describe the working principle and discuss the advantages of the technique and its limitations. We also review recent applications of this technique, including studies of structure-properties relationship, local conductivity of nanopillar arrays, electropolymerization of conjugated polymers, and molecular orientation of self-assembly structures. In the end, we discuss some potential improvements of future scanning probe based current sensing techniques.

Cite this page

References (48)

About this content

Title
Scanning Conductive Torsion Mode Microscopy
Book Title
Surface Science Tools for Nanomaterials Characterization
Book DOI
10.1007/978-3-662-44551-8
Chapter DOI
10.1007/978-3-662-44551-8_6
Part of
Volume
Editors
  • Challa S. S. R. Kumar (10)
  • Editor Affiliation
  • 10 Center for Advanced Microstructures and Devices, Baton Rouge, LA, USA
  • Authors
  • Ling Sun Send Email (1)
  • Elmar Bonaccurso Send Email (2) (3)
  • Author Affiliation
  • 1 Department of Micro- and Nanotechnology, Technical University of Denmark, Ørsteds Plads, Kgs. Lyngby, 2800, Denmark
  • 2 Center of Smart Interfaces, Technische Universität Darmstadt, Alarich-Weiss-Str. 10, 65287, Darmstadt, Germany
  • 3 Airbus Group Innovations, Metallic Technologies and Surface Engineering – TX2, 81663, Munich, Germany
  • Cite this content

    Citation copied