Field Ion and Field Desorption Microscopy: Principles and Applications

Abstract

The chapter describes the basic principles of the field ion (FIM) and field desorption (FDM) microscopies and of the probe-hole spectroscopic analysis of imaging species, as well as their applications for the studying of dynamic surface processes on the atomic scale.

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Title
Field Ion and Field Desorption Microscopy: Principles and Applications
Book Title
Surface Science Tools for Nanomaterials Characterization
Book DOI
10.1007/978-3-662-44551-8
Chapter DOI
10.1007/978-3-662-44551-8_7
Part of
Volume
Editors
  • Challa S. S. R. Kumar (10)
  • Editor Affiliation
  • 10 Center for Advanced Microstructures and Devices, Baton Rouge, LA, USA
  • Authors
  • Yuri Suchorski Send Email (1)
  • Author Affiliation
  • 1 Institute of Materials Chemistry, Vienna University of Technology, Getreidemarkt 9, 1060, Vienna, Austria
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