Applications of Synchrotron-Based X-Ray Photoelectron Spectroscopy in the Characterization of Nanomaterials

Abstract

X-ray photoelectron spectroscopy (XPS) has proved to be one of the most powerful experimental techniques for the chemical analysis of solid surfaces and nanomaterials. The use of synchrotron radiation (SR) as the excitation source of photoelectrons offers particular advantages compared to the conventional laboratory X-ray tubes and extends the capabilities of the technique. In this chapter we intend to give an overview of the synchrotron-based X-ray photoelectron spectroscopy (SR-XPS), giving emphasis to applications related to nanomaterials and, in particular, to nanoparticles (NPs).

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Title
Applications of Synchrotron-Based X-Ray Photoelectron Spectroscopy in the Characterization of Nanomaterials
Book Title
Surface Science Tools for Nanomaterials Characterization
Book DOI
10.1007/978-3-662-44551-8
Chapter DOI
10.1007/978-3-662-44551-8_9
Part of
Volume
Editors
  • Challa S. S. R. Kumar (10)
  • Editor Affiliation
  • 10 Center for Advanced Microstructures and Devices, Baton Rouge, LA, USA
  • Authors
  • W. H. Doh (1)
  • V. Papaefthimiou (1)
  • S. Zafeiratos Send Email (1)
  • Author Affiliation
  • 1 Institut de chimie et procédés pour l’énergie, l’environnement et la santé (ICPEES), UMR 7515 du CNRS-Université de Strasbourg, ECPM, 25 Rue Becquerel, F-67087, Cedex 8, Strasbourg, France
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