Magnetic Force Microscopy Characterization of Magnetic Nanowires and Nanotubes

Abstract

Magnetic force microscopy (MFM) is one of the operational modes of atomic force microscopy (AFM). In this mode, a magnetic probe is brought close to the sample surface and interacts with the magnetic stray fields emanating from the sample. The strength of the local magnetostatic interaction determines the vertical motion of the tip as it scans across the sample. Since early 1990s, it has been widely used in fundamental research on magnetic materials, as well as in the development of magnetic recording components. It has the capacity to map the local stray fields emanating from individual magnetic nanostructures of the sample, hence providing insight into its magnetic behavior.

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Title
Magnetic Force Microscopy Characterization of Magnetic Nanowires and Nanotubes
Book Title
Magnetic Characterization Techniques for Nanomaterials
Book DOI
10.1007/978-3-662-52780-1
Chapter DOI
10.1007/978-3-662-52780-1_5
Part of
Volume
Editors
  • Challa S.S.R. Kumar Send Email (1)
  • Editor Affiliation
  • 1 Integrated Mesoscale Architectures for Sustainable Catalysis (IMASC), Rowland Institute of Science, Harvard University, Cambridge, Massachusetts, USA
  • Authors
  • Muhammad Ramzan Tabasum Send Email (2)
  • Fatih Zighem Send Email (3)
  • Luc Piraux Send Email (2)
  • Bernard Nysten Send Email (2)
  • Author Affiliation
  • 2 Institute of Condensed Matter and Nanosciences, Bio and Soft Matter (IMCN/BSMA), Université catholique de Louvain, 1348, Louvain La Neuve, Belgium
  • 3 LSPM, CNRS-Université Paris 13, Sorbonne Paris Cité, 93430, Villetaneuse, France
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