Magnetic Force Microscopy

Abstract

Magnetic force microscopy (MFM) is scanning probe technique which enables the analysis of magnetic properties of the samples at the nanoscale using a microfabricated tip coated with a magnetic layer. In this chapter, we describe MFM and give an overview of its applications, ranging from well established to advanced new applications.

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Title
Magnetic Force Microscopy
Book Title
Magnetic Characterization Techniques for Nanomaterials
Book DOI
10.1007/978-3-662-52780-1
Chapter DOI
10.1007/978-3-662-52780-1_7
Part of
Volume
Editors
  • Challa S.S.R. Kumar Send Email (1)
  • Editor Affiliation
  • 1 Integrated Mesoscale Architectures for Sustainable Catalysis (IMASC), Rowland Institute of Science, Harvard University, Cambridge, Massachusetts, USA
  • Authors
  • Daniele Passeri Send Email (2)
  • Livia Angeloni Send Email (2)
  • Melania Reggente Send Email (2)
  • Marco Rossi Send Email (2) (3)
  • Author Affiliation
  • 2 Department of Basic and Applied Sciences for Engineering, SAPIENZA University of Rome, Via A. Scarpa 16, 00161, Rome, Italy
  • 3 Centro di Ricerca per le Nanotecnologie Applicate all’Ingegneria della Sapienza (CNIS), SAPIENZA University of Rome, Piazzale A. Moro 5, 00185, Rome, Italy
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