TY  - COMP
AU  - Wu, Haijun
AU  - He, Jiaqing
ED  - Kumar, Challa S.S.R.
TI  - Electron Microscopy for Characterization of Thermoelectric Nanomaterials: Datasheet from  · Volume : "Transmission Electron Microscopy Characterization of Nanomaterials" in SpringerMaterials (https://doi.org/10.1007/978-3-642-38934-4_10)
PB  - Springer-Verlag Berlin Heidelberg
UR  - https://materials.springer.com/lb/docs/sm_smf_978-3-642-38934-4_10
N1  - Copyright 2014 Springer-Verlag Berlin Heidelberg
ID  - SpringerMaterialsFundamentals2014:sm_smf_978-3-642-38934-4_10
ER  -