ThCu2Si2 (Cu2ThSi2, T = 300 K) Crystal Structure
General Information
- Phase Label(s): Cu2ThSi2
- Structure Class(es): BaAl4 family
- Classification by Properties: diamagnetic, metal
- Mineral Name(s): –
- Pearson Symbol: tI10
- Space Group: 139
- Phase Prototype: CeAl2Ga2
- Measurement Detail(s): film (determination of cell parameters), automatic diffractometer; Poland, Swierk, Institute of Nuclear Research, EWA reactor, DN-500 (determination of structural parameters), X-rays, Co Kα (determination of cell parameters), neutrons; λ = 0.1326 nm (determination of structural parameters), T = 300 K (determination of structural parameters)
- Phase Class(es): –
- Compound Class(es): silicide
- Interpretation Detail(s): complete structure determined, Rietveld refinement, RP = 0.045
- Sample Detail(s): sample prepared from Th, Cu, Si, powder (determination of cell and structural parameters)
Substance Summary
- Standard Formula: Cu2ThSi2
- Alphabetic Formula: Cu2Si2Th
- Published Formula: ThCu2Si2
- Refined Formula: Cu2Si2Th
- Wyckoff Sequence: 139,eda
- Z Formula Units: 2
- Density: ρ = 8.30 Mg·m−3
Crystallographic Data
Cell Parameters
Atom Coordinates
Standardized
Published
Displacement Parameters
Isotropic
Experimental Details
Reference
3D Interactive Structure
About this content
PAULING FILE Multinaries Edition – 2012
sd_0458903
©Springer & Material Phases Data System (MPDS), Switzerland & National Institute for Materials Science (NIMS), Japan, 2016
Pierre Villars, Material Phases Data System (MPDS), CH-6354 Vitznau, Switzerland
SpringerMaterials Release 2016.
Data generated pre-2002: © Springer & MPDS & NIMS; post-2001: © Springer & MPDS
All Rights Reserved. Version 2016.10.
Project Coordinator: Shuichi Iwata
Section-Editor: Karin Cenzual (Crystal Structures)
Cite this content