Sm2(SiO4)Te (Sm2[SiO4]Te mon, T = 153 K) Crystal Structure
General Information
- Phase Label(s): Sm2[SiO4]Te mon
- Structure Class(es): –
- Classification by Properties: –
- Mineral Name(s): –
- Pearson Symbol: mP32
- Space Group: 14
- Phase Prototype: Pr2[SiO4]Te
- Measurement Detail(s): automatic diffractometer (determination of cell parameters), automatic diffractometer; Bruker AXS SMART (determination of structural parameters), X-rays (determination of cell and structural parameters), T = 153 K (determination of cell and structural parameters)
- Phase Class(es): –
- Compound Class(es): orthosilicate
- Interpretation Detail(s): complete structure determined, full-matrix least-squares refinement; 1230 reflections; I > 2σ(I), R = 0.0274
- Sample Detail(s): sample prepared from BaTe, Sm, Zn, Te, energy-dispersive X-ray analysis; Sm2SiTe; O detected, single crystal (determination of cell and structural parameters)
Substance Summary
- Standard Formula: Sm2[SiO4]Te
- Alphabetic Formula: [SiO4]Sm2Te
- Published Formula: Sm2(SiO4)Te
- Refined Formula: O4SiSm2Te
- Wyckoff Sequence: 14,e8
- Z Formula Units: 4
- Density: ρ = 6.50 Mg·m−3
Crystallographic Data
Cell Parameters
Atom Coordinates
Standardized
Published
Displacement Parameters
Isotropic
Experimental Details
Reference
3D Interactive Structure
About this content
PAULING FILE Multinaries Edition – 2012
sd_1000926
©Springer & Material Phases Data System (MPDS), Switzerland & National Institute for Materials Science (NIMS), Japan, 2016
Pierre Villars, Material Phases Data System (MPDS), CH-6354 Vitznau, Switzerland
SpringerMaterials Release 2016.
Data generated pre-2002: © Springer & MPDS & NIMS; post-2001: © Springer & MPDS
All Rights Reserved. Version 2016.10.
Project Coordinator: Shuichi Iwata
Section-Editor: Karin Cenzual (Crystal Structures)
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