TmCu0.05Si1.66 (Cu0.05TmSi1.66) Crystal Structure
General Information
- Phase Label(s): Cu0.05TmSi1.66
- Structure Class(es): –
- Classification by Properties: –
- Mineral Name(s): –
- Pearson Symbol: oI12
- Space Group: 74
- Phase Prototype: GdSi1.4
- Measurement Detail(s): automatic diffractometer (determination of cell parameters), automatic diffractometer; DRON-3.0M (determination of structural parameters), X-rays, Cu Kα (determination of cell and structural parameters)
- Phase Class(es): –
- Compound Class(es): silicide
- Interpretation Detail(s): complete structure determined, Rietveld refinement; 18 variables, RP = 0.0571; wRP = 0.0820; RB = 0.0555
- Sample Detail(s): sample prepared from Cu, Tm, Si, powder (determination of cell and structural parameters)
Substance Summary
- Standard Formula: Cu0.05TmSi1.66
- Alphabetic Formula: Cu0.05Si1.66Tm
- Published Formula: TmCu0.05Si1.66
- Refined Formula: Cu0.05Si1.66Tm
- Wyckoff Sequence: 74,e3
- Z Formula Units: 4
- Density: ρ = 7.05 Mg·m−3
Crystallographic Data
Cell Parameters
Atom Coordinates
Standardized
Published
Displacement Parameters
Isotropic
Experimental Details
Reference
3D Interactive Structure
About this content
PAULING FILE Multinaries Edition – 2012
sd_1229743
©Springer & Material Phases Data System (MPDS), Switzerland & National Institute for Materials Science (NIMS), Japan, 2016
Pierre Villars, Material Phases Data System (MPDS), CH-6354 Vitznau, Switzerland
SpringerMaterials Release 2016.
Data generated pre-2002: © Springer & MPDS & NIMS; post-2001: © Springer & MPDS
All Rights Reserved. Version 2016.10.
Project Coordinator: Shuichi Iwata
Section-Editor: Karin Cenzual (Crystal Structures)
Cite this content