SiO2 low-temperature quartz-type (SiO2 rt) Crystal Structure
General Information
- Phase Label(s): SiO2 rt
- Structure Class(es): –
- Classification by Properties: diamagnetic, ionic conductor, metal, piezoelectric, semiconductor
- Mineral Name(s): quartz low
- Pearson Symbol: hP9
- Space Group: 152
- Phase Prototype: SiO2
- Measurement Detail(s): automatic diffractometer; 25 (determination of cell parameters), automatic diffractometer; Philips PW1100 (determination of structural parameters), X-rays, Mo Kα; λ = 0.071069 nm (determination of cell and structural parameters)
- Phase Class(es): –
- Compound Class(es): silicate
- Interpretation Detail(s): complete structure determined, least-squares refinement on F; 15 variables; 205 reflections; I > 3σ(I), R = 0.056; wR = 0.023
- Sample Detail(s): single crystal (determination of cell parameters), single crystal, 0.04×0.10×0.14 mm3 (determination of structural parameters)
Substance Summary
- Standard Formula: SiO2
- Alphabetic Formula: O2Si
- Published Formula: SiO2 low-temperature quartz-type
- Refined Formula: O2Si
- Wyckoff Sequence: 152,ca
- Z Formula Units: 3
- Density: ρ = 2.64 Mg·m−3
Crystallographic Data
Cell Parameters
Atom Coordinates
Standardized
Published
Displacement Parameters
Isotropic
Anisotropic
Experimental Details
Reference
3D Interactive Structure
About this content
PAULING FILE Multinaries Edition – 2012
sd_1250476
©Springer & Material Phases Data System (MPDS), Switzerland & National Institute for Materials Science (NIMS), Japan, 2016
Pierre Villars, Material Phases Data System (MPDS), CH-6354 Vitznau, Switzerland
SpringerMaterials Release 2016.
Data generated pre-2002: © Springer & MPDS & NIMS; post-2001: © Springer & MPDS
All Rights Reserved. Version 2016.10.
Project Coordinator: Shuichi Iwata
Section-Editor: Karin Cenzual (Crystal Structures)
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