Ho0.67Ni2Ga5−xGex, x= 0.60 (Ho0.67Ni2Ga4.4Ge0.6) Crystal Structure
General Information
- Phase Label(s): Ho0.67Ni2Ga4.4Ge0.6
- Structure Class(es): –
- Classification by Properties: metal
- Mineral Name(s): –
- Pearson Symbol: hP20
- Space Group: 194
- Phase Prototype: Sc0.6Fe2Si4.9
- Measurement Detail(s): automatic diffractometer (determination of cell parameters), automatic diffractometer; Siemens SMART (determination of structural parameters), X-rays, Mo Kα; λ = 0.071073 nm (determination of cell and structural parameters), T = 293 K (determination of cell and structural parameters)
- Phase Class(es): –
- Compound Class(es): intermetallic
- Interpretation Detail(s): complete structure determined, full-matrix least-squares refinement on F2; 19 variables; I > 0σ(I), R = 0.0338; wR = 0.0849
- Sample Detail(s): sample prepared from Ho, Ni, Ga, Ge, single crystal (determination of cell parameters), single crystal, 0.06×0.08×0.1 mm3 (determination of structural parameters)
Substance Summary
- Standard Formula: Ho0.67Ni2Ga4.4Ge0.6
- Alphabetic Formula: Ga4.4Ge0.6Ho0.67Ni2
- Published Formula: Ho0.67Ni2Ga5−xGex, x= 0.60
- Refined Formula: Ga4.30Ge0.70Ho0.67Ni2
- Wyckoff Sequence: 194,hf2ec
- Z Formula Units: 2
- Density: ρ = 8.11 Mg·m−3
Crystallographic Data
Cell Parameters
Atom Coordinates
Standardized
Published
Displacement Parameters
Isotropic
Anisotropic
Experimental Details
Reference
3D Interactive Structure
About this content
PAULING FILE Multinaries Edition – 2012
sd_1410861
©Springer & Material Phases Data System (MPDS), Switzerland & National Institute for Materials Science (NIMS), Japan, 2016
Pierre Villars, Material Phases Data System (MPDS), CH-6354 Vitznau, Switzerland
SpringerMaterials Release 2016.
Data generated pre-2002: © Springer & MPDS & NIMS; post-2001: © Springer & MPDS
All Rights Reserved. Version 2016.10.
Project Coordinator: Shuichi Iwata
Section-Editor: Karin Cenzual (Crystal Structures)
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