XeF6 (T = 133(2) K) Crystal Structure
General Information
- Phase Label(s): XeF6 mon1
- Structure Class(es): –
- Classification by Properties: –
- Mineral Name(s): –
- Pearson Symbol: mP224
- Space Group: 14
- Phase Prototype: XeF6
- Measurement Detail(s): automatic diffractometer (determination of cell parameters), automatic diffractometer; Bruker AXS SMART (determination of structural parameters), X-rays, Mo Kα; λ = 0.071073 nm (determination of cell and structural parameters), T = 133(2) K (determination of cell and structural parameters)
- Phase Class(es): –
- Compound Class(es): fluoride
- Interpretation Detail(s): complete structure determined, full-matrix least-squares refinement on F2; 505 variables; 8357 reflections; I > 2σ(I), R = 0.033; wR = 0.0780
- Sample Detail(s): sample prepared from F2, Xe, NaF, single crystal (determination of cell parameters), single crystal, 0.1×0.1×0.2 mm3 (determination of structural parameters)
Substance Summary
- Standard Formula: XeF6
- Alphabetic Formula: F6Xe
- Published Formula: XeF6
- Refined Formula: F6Xe
- Wyckoff Sequence: 14,e56
- Z Formula Units: 32
- Density: ρ = 3.83 Mg·m−3
Crystallographic Data
Cell Parameters
Atom Coordinates
Standardized
Published
Displacement Parameters
Isotropic
Anisotropic
Experimental Details
Reference
3D Interactive Structure
About this content
PAULING FILE Multinaries Edition – 2012
sd_1421342
©Springer & Material Phases Data System (MPDS), Switzerland & National Institute for Materials Science (NIMS), Japan, 2016
Pierre Villars, Material Phases Data System (MPDS), CH-6354 Vitznau, Switzerland
SpringerMaterials Release 2016.
Data generated pre-2002: © Springer & MPDS & NIMS; post-2001: © Springer & MPDS
All Rights Reserved. Version 2016.10.
Project Coordinator: Shuichi Iwata
Section-Editor: Karin Cenzual (Crystal Structures)
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