Ho11Ge8.75Si1.25 (T = 5.8 K) Crystal Structure
General Information
- Phase Label(s): Ho11Ge8.75Si1.25
- Structure Class(es): –
- Classification by Properties: –
- Mineral Name(s): –
- Pearson Symbol: tI84
- Space Group: 139
- Phase Prototype: Ho11Ge10
- Measurement Detail(s): automatic diffractometer (determination of cell parameters), automatic diffractometer; Switzerland, Würenlingen, Paul Scherrer Institute, SAPHIR reactor (determination of structural parameters), neutrons; λ = 0.2346 nm (determination of cell and structural parameters), T = 5.8 K (determination of cell and structural parameters)
- Phase Class(es): –
- Compound Class(es): silicide
- Interpretation Detail(s): complete structure determined; magnetic structure determined, Rietveld refinement, RP = 0.07; wRP = 0.13
- Sample Detail(s): sample prepared from Ho, Ge, Si, powder (determination of cell and structural parameters)
Substance Summary
- Standard Formula: Ho11Ge8.75Si1.25
- Alphabetic Formula: Ge8.75Ho11Si1.25
- Published Formula: Ho11Ge8.75Si1.25
- Refined Formula: Ge8.75Ho11Si1.25
- Wyckoff Sequence: 139,n2mjh2e2d
- Z Formula Units: 4
- Density: ρ = 8.77 Mg·m−3
Crystallographic Data
Cell Parameters
Atom Coordinates
Standardized
Published
Experimental Details
Reference
3D Interactive Structure
About this content
PAULING FILE Multinaries Edition – 2012
sd_1625238
©Springer & Material Phases Data System (MPDS), Switzerland & National Institute for Materials Science (NIMS), Japan, 2016
Pierre Villars, Material Phases Data System (MPDS), CH-6354 Vitznau, Switzerland
SpringerMaterials Release 2016.
Data generated pre-2002: © Springer & MPDS & NIMS; post-2001: © Springer & MPDS
All Rights Reserved. Version 2016.10.
Project Coordinator: Shuichi Iwata
Section-Editor: Karin Cenzual (Crystal Structures)
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