ε-TaN (TaN rt) Crystal Structure
General Information
- Phase Label(s): TaN rt
- Structure Class(es): –
- Classification by Properties: –
- Mineral Name(s): –
- Pearson Symbol: hP6
- Space Group: 189
- Phase Prototype: TaN
- Measurement Detail(s): Guinier-de Wolff film (determination of cell parameters), diffractometer; Denmark, Roskilde, Riso National Laboratory, DR3 reactor, TAS1 (determination of structural parameters), X-rays, Cu Kα1; λ = 0.154051 nm (determination of cell parameters), neutrons; λ = 0.1007 nm (determination of structural parameters)
- Phase Class(es): –
- Compound Class(es): nitride
- Interpretation Detail(s): complete structure determined, Rietveld refinement; 11 variables, R = 0.0370
- Sample Detail(s): sample prepared from Ta, N2, comparison of cell parameters; no traces of β-Ta2N detected, powder (determination of cell and structural parameters)
Substance Summary
- Standard Formula: TaN
- Alphabetic Formula: NTa
- Published Formula: ε-TaN
- Refined Formula: NTa
- Wyckoff Sequence: 189,fda
- Z Formula Units: 3
- Density: ρ = 14.27 Mg·m−3
Crystallographic Data
Cell Parameters
Atom Coordinates
Standardized
Published
Displacement Parameters
Isotropic
Experimental Details
Reference
3D Interactive Structure
About this content
PAULING FILE Multinaries Edition – 2012
sd_1700292
©Springer & Material Phases Data System (MPDS), Switzerland & National Institute for Materials Science (NIMS), Japan, 2016
Pierre Villars, Material Phases Data System (MPDS), CH-6354 Vitznau, Switzerland
SpringerMaterials Release 2016.
Data generated pre-2002: © Springer & MPDS & NIMS; post-2001: © Springer & MPDS
All Rights Reserved. Version 2016.10.
Project Coordinator: Shuichi Iwata
Section-Editor: Karin Cenzual (Crystal Structures)
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