Sc4Pt7Si2 Crystal Structure
General Information
- Phase Label(s): Sc4Pt7Si2
- Structure Class(es): –
- Classification by Properties: –
- Mineral Name(s): –
- Pearson Symbol: oP26
- Space Group: 55
- Phase Prototype: Sc4Pt7Si2
- Measurement Detail(s): Guinier film (determination of cell parameters), automatic diffractometer; STOE IPDS II (determination of structural parameters), X-rays, Cu Kα1 (determination of cell parameters), X-rays, Mo Kα; λ = 0.071073 nm (determination of structural parameters)
- Phase Class(es): –
- Compound Class(es): silicide
- Interpretation Detail(s): complete structure determined, full-matrix least-squares refinement on F2; 42 variables; 566 reflections; I > 2σ(I), R = 0.0243; wR = 0.0480
- Sample Detail(s): sample prepared from Sc, Pt, Si, energy-dispersive X-ray analysis; 32(1) at.% Sc, 54(1) at.% Pt, 14(1) at.% Si, powder (determination of cell parameters), single crystal, 0.01×0.03×0.08 mm3 (determination of structural parameters)
Substance Summary
- Standard Formula: Sc4Pt7Si2
- Alphabetic Formula: Pt7Sc4Si2
- Published Formula: Sc4Pt7Si2
- Refined Formula: Pt7Sc4Si2
- Wyckoff Sequence: 55,h3g3a
- Z Formula Units: 2
- Density: ρ = 12.73 Mg·m−3
Crystallographic Data
Cell Parameters
Atom Coordinates
Standardized
Published
Displacement Parameters
Isotropic
Anisotropic
Experimental Details
Reference
3D Interactive Structure
About this content
PAULING FILE Multinaries Edition – 2012
sd_1931034
©Springer & Material Phases Data System (MPDS), Switzerland & National Institute for Materials Science (NIMS), Japan, 2016
Pierre Villars, Material Phases Data System (MPDS), CH-6354 Vitznau, Switzerland
SpringerMaterials Release 2016.
Data generated pre-2002: © Springer & MPDS & NIMS; post-2001: © Springer & MPDS
All Rights Reserved. Version 2016.10.
Project Coordinator: Shuichi Iwata
Section-Editor: Karin Cenzual (Crystal Structures)
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