Landolt-Börnstein - Group III Condensed Matter

12.2.2 Grain boundary tracer impurity diffusion in pure materials

Abstract

This chapter provides data for grain boundary tracer impurity diffusion in pure materials like Ag, Al, Al2O3, Au, Cd, Co, Cr, Cu, CuInSe2, Er2O3, Fe, H2O, InSb, KCl, KI, MgO, Mo, NaCl, Nb, Ni, NiO, Pb, Pt, Si, Sn, Ta, TaSi2, ThO2, UC0.95, V, W, Y, and Zr. The values of pre-exponential factor, activation enthalpy and temperature for grain boundary impuritiy diffusion are tabulated for pure materials. In addition, the table shows various methods of determination including sectioning combined with residual-activity, serial sectioning, electron probe microanalysis, Auger electron spectroscopy, electrical resistivity measurement, Rutherford backscattering spectroscopy, autoradiography and secondary-ion mass spectrometry. Additional information on purity of the above materials is given.

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Title
12.2.2 Grain boundary tracer impurity diffusion in pure materials
Book Title
Diffusion in Solid Metals and Alloys
In
12.2 Data for grain and interphase boundary diffusion
Book DOI
10.1007/b37801
Chapter DOI
10.1007/10390457_125
Part of
Landolt-Börnstein - Group III Condensed Matter
Volume
26
Editors
  • H. Mehrer
  • Authors
  • I. Kaur
  • W. Gust
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