Landolt-Börnstein - Group III Condensed Matter

8.3.1.3 In Plane Diffraction (IPD)

Abstract

This chapter discusses in-plane diffraction (IPD) of surface structures. IPD has been used frequently since the beginning of X-ray diffraction from surfaces, but detailed studies of the inherent mechanism of diffraction were published several years later. In a recent synchrotron experiment structural information about first few atomic surface layers was obtained by examining the distribution in space of the KH diffracted intensity for a metal crystal alloy (Fe3Al). It may also be noted that IPD is one way, but not the only one, to do surface scattering. Another technique is based on making use of oblique diffracting planes. In a recent experiment, the loss of crystallinity at the surface of a silicon crystal was observed during laser annealing by making use of a time resolved diffraction technique. The main difference between the two approaches is that IPD is mostly sensitive to atomic displacements parallel to the surface whereas diffraction from oblique planes can also provide information about displacements perpendicular to the surface, which is what happens when a laser beam is flashed onto the crystal.

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Title
8.3.1.3 In Plane Diffraction (IPD)
Book Title
Interaction of Radiation with Surfaces and Electron Tunneling
In
8.3.1 Introduction
Book DOI
10.1007/b51875
Chapter DOI
10.1007/10119615_45
Part of
Landolt-Börnstein - Group III Condensed Matter
Volume
24D
Editors
  • G. Chiarotti
  • Authors
  • R. Colella
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