Landolt-Börnstein - Group VIII Advanced Materials and Technologies

12.3 Defect analysis

Abstract

This document is part of Subvolume B 'Laser Systems', Part 3 of Volume 1 'Laser Physics and Applications' of Landolt-Börnstein Group VIII 'Advanced Materials and Technologies'.

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Title
12.3 Defect analysis
Book Title
Laser Systems
In
12 Laser diode characterization and testing
Book DOI
10.1007/978-3-642-14177-5
Chapter DOI
10.1007/978-3-642-14177-5_11
Part of
Landolt-Börnstein - Group VIII Advanced Materials and Technologies
Volume
1B3
Editors
  • H. Weber Send Email (11)
  • P. Loosen Send Email (12)
  • R. Poprawe Send Email (12)
  • Editor Affiliation
  • 11 Institut für Optik und Atomare Physik, Technische Universität Berlin, Berlin, Germany
  • 12 Fraunhofer-Institut für Lasertechnik (ILT), Aachen, Germany
  • Authors
  • B. Sumpf Send Email (104_11)
  • U. Zeimer (104_11)
  • Author Affiliation
  • 104_11 Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Berlin, Germany
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