Angle-Resolved Surface-Enhanced Raman Scattering

Abstract

This chapter describes the use of angle-resolved techniques to study the Raman scattering arising from periodic metallic arrays. By matching the angle-dependent reflectivity with Raman spectroscopy, it is possible to single out a particular electromagnetic resonance and study its contribution to surface-enhanced Raman scattering (SERS). The SERS obtained from these periodic structures exhibit strong spectral and angular dependences that are associated with the generation and decay processes of the various electromagnetic resonance modes. The dispersion relation of surface plasmon polaritons (SPPs) on a flat metal surface is illustrated. Here, interference lithography has been used for preparation of 1D and 2D periodic metallic arrays. For angle-resolved measurements, a home-built computer-controlled goniometer is used and two types of measurements, namely, angle-dependent reflectivity and Raman spectroscopy are shown. Enhanced Raman intensity is observed whenever the excitation laser and Raman emissions coincide with the ingoing and outgoing SPPs, leading to a strong angular dependence of SERS.

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Title
Angle-Resolved Surface-Enhanced Raman Scattering
Book Title
Raman Spectroscopy for Nanomaterials Characterization
Book DOI
10.1007/978-3-642-20620-7
Chapter DOI
10.1007/978-3-642-20620-7_1
Part of
Volume
Editors
  • Challa S. S. R. Kumar (1)
  • Editor Affiliation
  • 1 Center for Advanced Microstructures and Devices, Baton Rouge, LA, USA
  • Authors
  • C. Y. Chan (1_1)
  • J. Li (1_1)
  • H. C. Ong (1_1)
  • J. B. Xu (2_1)
  • Mary M. Y. Waye (3_1)
  • Author Affiliation
  • 1_1 Department of Physics, The Chinese University of Hong Kong, Shatin, NT, Hong Kong
  • 2_1 Department of Electronic Engineering, The Chinese University of Hong Kong, Shatin, NT, Hong Kong
  • 3_1 School of Biomedical Sciences, The Chinese University of Hong Kong, Shatin, NT, Hong Kong
  • Cite this content

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