Electrical and Optical Enhancement Properties of Metal/Semimetal Nanostructures for Metal Oxide UV Photodetectors

Abstract

Ultraviolet (UV) photodetectors are of a great interest to a wide range of industrial, military, environmental, and biomedical applications. Because of many advantages including low cost, ease of fabrication, high sensitivity, and strong radiation hardness, metal oxide nanostructures are considered promising materials for UV detection. A review of the most recent developments in the field of metal oxide UV photodetectors is divided into two sections. The first section introduces the basic properties of various wide bandgap metal oxides, the UV detection mechanism, and the figures of merit of UV photodetectors. Performance comparison of UV photodetectors using various metal oxide nanostructures and device configurations is also presented in the first section. The second section is devoted to metal/semimetal nanostructures for the performance enhancement of UV photodetectors, which illustrate enhanced devices using either surface plasmon resonance or a carrier transfer mechanism.

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Title
Electrical and Optical Enhancement Properties of Metal/Semimetal Nanostructures for Metal Oxide UV Photodetectors
Book Title
Handbook of Nanomaterials Properties
Book DOI
10.1007/978-3-642-31107-9
Chapter DOI
10.1007/978-3-642-31107-9_49
Part of
Volume
Editors
  • Bharat Bhushan Send Email (1)
  • Dan Luo Send Email (2)
  • Scott R. Schricker Send Email (3)
  • Wolfgang Sigmund Send Email (4)
  • Stefan Zauscher Send Email (5)
  • Editor Affiliation
  • 1 Nanoprobe Laboratory for Bio- & Nanotechnology and Biomimetics, Ohio State University, Columbus, Ohio, USA
  • 2 Department of Biological and Environmental Engineering, Cornell University, Ithaca, New York, USA
  • 3 Division of Restorative, Prosthetic and Primary Care, The Ohio State University, College of Dentistry, Columbus, Ohio, USA
  • 4 Department of Materials Science and Engineering, University of Florida, Gainesville, Florida, USA
  • 5 Department of Mechanical Engineering and Materials Science, Duke University, Durham, North Carolina, USA
  • Authors
  • Shayla Sawyer Send Email (6)
  • Dali Shao (6)
  • Author Affiliation
  • 6 Electrical, Computer, and Systems Engineering Department, Rensselaer Polytechnic Institute, Troy, NY, 12180, USA
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