TEM for Characterization of Nanocomposite Oxide Thin Films: A Case Study on Solution-Derived Lanthanum Strontium Manganites

Abstract

A transmission electron microscope (TEM) allows for direct observation of interfaces and nanoscale particles embedded in a matrix with atomic spatial resolution. It provides chemical and structural information and allows for local strain mapping by the geometrical phase analysis (GPA) technique combined with high-resolution TEM (HRTEM) imaging. In this chapter we apply these capabilities of TEM to the study of epitaxial nanocomposite manganite thin films formed by spontaneous phase separation using a chemical solution deposition route. A methodology to obtain the most significant structural and chemical features from nanocomposite functional films is described.

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Title
TEM for Characterization of Nanocomposite Oxide Thin Films: A Case Study on Solution-Derived Lanthanum Strontium Manganites
Book Title
Transmission Electron Microscopy Characterization of Nanomaterials
Book DOI
10.1007/978-3-642-38934-4
Chapter DOI
10.1007/978-3-642-38934-4_11
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Volume
Editors
  • Challa S.S.R. Kumar Send Email (1)
  • Editor Affiliation
  • 1 Center for Advanced Microstructures and Devices, Baton Rouge, Louisiana, USA
  • Authors
  • Patricia Abellán Send Email (2)
  • César Moreno Send Email (3)
  • Felip Sandiumenge (4)
  • Xavier Obradors (4)
  • Author Affiliation
  • 2 Physical Sciences Division, Pacific Northwest National Laboratory, Richland, WA, 99352, USA
  • 3 International Center for Young Scientist, National Institute for Materials Science, 305-0047, Tsukuba, Ibaraki, Japan
  • 4 Institut de Ciencia de Materials de Barcelona, CSIC, Campus de la UAB, 08193, Bellaterra, Spain
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