TEM for Characterization of Semiconductor Nanomaterials

Abstract

Transmission electron microscopy provides a wide range of methods to study the morphology, the crystal structure and perfection, the chemistry, and the magnetic and the electronic properties of the matter at the highest spatial resolution. In this chapter some TEM approaches to study nanostructured semiconductors will be described with the help of practical examples of their application to different kinds of material systems.

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Title
TEM for Characterization of Semiconductor Nanomaterials
Book Title
Transmission Electron Microscopy Characterization of Nanomaterials
Book DOI
10.1007/978-3-642-38934-4
Chapter DOI
10.1007/978-3-642-38934-4_3
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Editors
  • Challa S.S.R. Kumar Send Email (1)
  • Editor Affiliation
  • 1 Center for Advanced Microstructures and Devices, Baton Rouge, Louisiana, USA
  • Authors
  • Elvio Carlino Send Email (2)
  • Author Affiliation
  • 2 Centro di Microscopia Elettronica – Consiglio Nazionale delle Ricerche – Istituto di Officina dei Materiali (CNR-IOM-TASC), Blg. MM Area Science Park Basovizza – SS 14, 34149, Trieste, Italy
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