MSI Eureka

Partial liquidus surface of the Al-corner with primary crastallization fields of (Al), (Si), {tau}, {beta}, {eta} and {teta}

Figure 2 from evaluation report:

Al-Cr-Si Ternary Phase Diagram Evaluation

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Recorded Points

General Information

  • Concentration Range: Al conc. [85-100 at.%] vs. Si conc. [0-15 at.%] vs. Cr conc. [0-15 at.%]

Reference

About this content

  • Database name

    MSI Eureka

  • Dataset ID

    sm_msi_r_10_012728_02_full_LnkDia0

  • Copyright

    © MSI Materials Science International Services GmbH 2004

  • Chief Editor

    Günter Effenberg, Stuttgart

    effenberg@msiport.com

  • Credits

    Figure taken from MSI Eureka Evaluation Report 10.12728.2.7

    System Name: Al-Cr-Si

    Report Authors: Rainer Schmid-Fetzer and MSIT®®

    MSIT® is a registered trademark of MSI Materials Science International Services GmbH.

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