MSI Eureka

Partial liquidus surface projection

Figure 2 from evaluation report:

Cu-In-Sn Ternary Phase Diagram Evaluation

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Recorded Points

General Information

  • Concentration Range: In conc. [0-50 at.%] vs. Sn conc. [0-50 at.%] vs. Cu conc. [50-100 at.%]


About this content

  • Database name

    MSI Eureka

  • Dataset ID


  • Copyright

    © MSI Materials Science International Services GmbH 2006

  • Chief Editor

    Günter Effenberg, Stuttgart

  • Credits

    Figure taken from MSI Eureka Evaluation Report 10.21071.1.1

    System Name: Cu-In-Sn

    Report Authors: Tamara Velikanova, Michail Turchanin, Olga Fabrichnaya and MSIT®®

    MSIT® is a registered trademark of MSI Materials Science International Services GmbH.

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